The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.
Supporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.
The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.
When you set up a user account with our website, the order process is quicker and you can enjoy the many functions of your account,
including your wishlist. With your customer account, you can also check the status of your order, and much more.
When you set up a user account with our website, the order process is quicker and you can enjoy the many functions of your account,
including your wishlist. With your customer account, you can also check the status of your order, and much more.
http://www.e-tronics.hu//p/c2-extra-large-envelope-x-ray_ct-inspection-system/c2C2C2 Extra large-envelope X-ray/CT inspection systemhttp://www.e-tronics.hu//Content/common/images/NoImage-600_600.jpg0.00EURInStock/Ipari röntgen és CT berendezések/NIKON METROLOGY/Egyedi megoldások (Large Envelope System)<p style="text-align: justify;"><span data-sheets-value="{"1":2,"2":"The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.\n\nSupporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.\n\nThe linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.\n\n"}" data-sheets-userformat="{"2":14721,"3":{"1":1},"10":0,"11":4,"14":{"1":3,"3":1},"15":"Calibri","16":11}">The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.<br /><br />Supporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.<br /><br />The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.<br /><br /></span></p>EUR
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