The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.
Supporting dual sources up to 450 kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.
The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.